Conveniently Measure Dielectric Properties

ε – permittivity
tan δ – loss tangent
in bands between 25 GHz and 1100 GHz

MCK

Accurate Relsults
Faster Solutions
Reliable

Material Characterisation Kit

The Material Characterisation Kit (MCK) is a dielectric material characterisation solution in bands over a wide frequency range between 25 GHz and 1100 GHz. Dielectric properties of materials can be measured in a quick, convenient, and reliable way.

Requirements

The MCK is an easy-to-use device accessible to all levels of expertise. To perform measurements you only need your MCK, a VNA, and your sample.

A vector network analyser (VNA) with time domain extension covering the frequencies corresponding with your MCK.

A recommended size for a solid sample is 50x50x5 mm. Boundary case: 18x18 mm minimum surface, 21 mm maximum thickness. Sizes may vary with the model and material type.

Complementary products

Calibrated holders

Standard MCK has been developed for solid samples. For all other material types, SWISSto12 can provide with an appropriate solution.

Already available:
  • Soft and foams
  • Liquids and powders
  • Coatings and multilayers

WebMCK software

SWISSto12 has developed the software with easy interface for easy extraction of material properties in couple of minutes.

A full automation of measurement process:
  • Available for all the main OS
  • No installation required
  • Compatible with most VNA mainframes

What’s Included

MCK

Protective caps

Calibration short

Screws to connect cables

Peli protector case

MCK

Protective caps

Calibration short

Screws to connect cables

Peli protector case

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